![]() ![]() In contrast to extensive studies indicating the segregation of Zr and B, we show unambiguously the segregation of Si to low melting point liquid films and thereby enhancing the susceptibility to solidification cracking in IC21 produced by SEBM. The terminal liquid is trapped at boundaries between dendrites and grains, as evidenced by the liquid films on cracked surfaces. The pronounced inter-dendritic eutectic regions suggest that a significant elemental partitioning between the liquid and solid occurred during the SEBM. There are distinct differences between dendrites and inter-dendritic regions with the presence of coarse γ+γ′ eutectic and secondary solidification microconstituents (Cr and Mo-rich) in the latter. ![]() ![]() Selective electron beam melting (SEBM) was used to process crack-free Ni 3Al-based IC21 alloy (low density superalloy) containing ~85% γ′-volume fraction. ![]()
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March 2023
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